Materials’ Analysis and Characterization Techniques
Module Title: Materials’ Analysis and Characterization Techniques
Hours per Week: 3 hours courses
Prerequisite knowledge: structure of matter
Purpose of the Module:
- understanding modern analytical techniques used in physical sciences and materials research.
- knowledge of the foundational principles and applications techniques for the analysis of materials and surfaces.
Syllabus:
Chapter One: Spectroscopic Ellipsometry
Chapter Two: Mass Spectroscopy
Chapter Three: X-Ray Spectroscopy
Chapter Four: Electron spectroscopy
Chapter Five: Nuclear spectroscopy
“Seeing is spectroscopy: we perceive the world via the interaction of visible light with the light receptors in our eyes. The light is emitted from the sun or from other light sources. It is then reflected from (or transmitted through) the objects in our surroundings. In these processes, the color changes because some of the light is absorbed by the objects. How much and what spectral regions are absorbed depends on the atoms and molecules in these objects. The light not absorbed reaches our eyes. It carries the information of the molecular structure of our surroundings with it. In our eyes its color is analysed by 3 different types of photoreceptors which absorb different light in spectral regions. In this way we perform a spectroscopic experiment every time we look at things. There is a light source, and object that reflects, transmits, scatters and absorbs light and a wavelength dependent detector in our eyes. An apparatus for spectroscopic studies is called spectrometer and a plot of a particular property of matter against wavelength, frequency or energy of radiation is called spectrum”[1].
Special | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | ALL
A |
|---|
An Introduction to SpectroscopyIntroduction to Spectroscopy | |
C |
|---|
CHARACTERIZATION AND ANALYSISMICROELECTRONIC APPLICATIONS OF THE SCANNING ELECTRON MICROSCOPE NONDESTRUCTIVE THICKNESS MEASUREMENTS X-RAY DIFFRACTION | |
E |
|---|
Electron MicroscopyElectrons Interactions with Matter | |
G |
|---|
Gamma-ray imaging system | |
M |
|---|
Mass SpectroscopyBasic principle Brief outline of instrumentation Ion formation and types Fragmentation processes | |
N |
|---|
Neutron Activation AnalysisPrinciple of method | |
P |
|---|
Production of X-RAYS using X-RAY TubeHistory of X-RAY Production of X-RAY Components of X-RAY tubes Applications in various fields | |
S |
|---|
SEMScanning Electron Microscopy: Principle and Applications in Nanomaterials Characterization | |
STMAdvanced Scanning Probe Microscopy of Graphene and Other 2D Materials | |
X |
|---|
X-ray interactionsThe nature of X rays | |